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The atomic force microscopy (AFM) is a subcategory of scanning probe microscopy (SPM). SPMs are instruments that use a raster-scanning tip to measure surfaceAn AFM generates images by scanning a small cantilever over the surface of a sample. The sharp tip on the end of the cantilever contacts the surface, Atomic Force Microscopy (AFM). Arvind Raman, Associate Professor. Mechanical Engineering. Birck Nanotechnology Center. NASA Institute of Nanoelectronics and Components of an AFM. Cantilever. Deflection sensing. Feedback Atomic Force Microscope deflection sensor approach. Data acquisition scanner feedback. Resolution (magnification) at Z-direction is normally higher than X-Y. Page 13. AFM imaging: from mm to nm, to A. Magnetic bits of Atomic Force Microscopy. I). How it works and why we do it? II). Theory and History i) STM vs. AFM ii) Scanning Probe Microscopy iii) Theory.

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